International Standard
ISO 21222:2020
Surface chemical analysis — Scanning probe microscopy — Procedure for the determination of elastic moduli for compliant materials using atomic force microscope and the two-point JKR method
Reference number
ISO 21222:2020
ISO 21222:2020
Edición 1
2020-01
2020-01
© ISO 2024
International Standard
Resumen
This document describes a procedure for the determination of elastic modulus for compliant materials using atomic force microscope (AFM). Force-distance curves on the surface of compliant materials are measured and the analysis uses a two-point method based on Johnson-Kendall-Roberts (JKR) theory. This document is applicable to compliant materials with elastic moduli ranging from 100 kPa to 1 GPa. The spatial resolution is dependent on the contact radius between the AFM probe and the surface and is typically approximately10-20 nm.
Informaciones generales
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Estado: PublicadoFecha de publicación: 2020-01Etapa: Norma Internacional publicada [60.60]
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Edición: 1Número de páginas: 17
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Comité Técnico :ISO/TC 201/SC 9ICS :71.040.40
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