ISO 16526-1:2011
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ISO 16526-1:2011
57042

Abstract  Preview

ISO 16526-1:2011 specifies a method for the direct and absolute measurement of the average high voltage of constant potential (DC) X-ray systems on the secondary side of the high voltage generator. The intention is to check the correspondence with the indicated high voltage value on the control unit of the X-ray system.

This method is applied to assure a reproducible operation of X-ray systems because the voltage influences particularly the penetration of materials and the contrast of X-ray images and also the requirements concerning the radiation protection.


General information 

  •  :  Published
     : 2011-12
  •  : 1
     : 2
  •  : ISO/TC 135/SC 5 Radiographic testing
  •  :
    19.100 Non-destructive testing

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std 2 38 Paper
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