International Standard
ISO 17915:2018
Optics and photonics — Measurement method of semiconductor lasers for sensing
Reference number
ISO 17915:2018
Edition 1
2018-05
International Standard
Read sample
ISO 17915:2018
72946
Published (Edition 1, 2018)
This standard was last reviewed and confirmed in 2023. Therefore this version remains current.

ISO 17915:2018

ISO 17915:2018
72946
Language
Format
CHF 151
Convert Swiss francs (CHF) to your currency

Abstract

This document describes methods of measuring temperature and injected current dependence of lasing wavelengths, and lasing spectral line width in relation to semiconductor lasers for sensing applications.

This document is applicable to all kinds of semiconductor lasers, such as edge-emitting type and vertical cavity surface emitting type lasers, bulk-type and (strained) quantum well lasers, and quantum cascade lasers, used for optical sensing in e.g. industrial, medical and agricultural fields.

General information

  •  : Published
     : 2018-05
    : International Standard confirmed [90.93]
  •  : 1
     : 29
  • ISO/TC 172/SC 9
    31.260 
  • RSS updates

Got a question?

Check out our Help and Support

Check out our FAQs

Customer care
+41 22 749 08 88

Opening hours:
Monday to Friday - 09:00-12:00, 14:00-17:00 (UTC+1)