This standard was last reviewed and confirmed in 2019.
Therefore this version remains current.
Abstract
PreviewISO 18452:2005 specifies a method for the determination of the film thickness of a fine ceramic film and ceramic coatings by a contact-probe profilometer. The method is suitable for film thicknesses in the range of 10 nm to 10 000 nm.
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Status: PublishedPublication date: 2005-11
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Edition: 1Number of pages: 9
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- ICS :
- 81.060.30 Advanced ceramics
Buy this standard
en
| Format | Language | |
|---|---|---|
| std 1 61 | ||
| std 2 61 | Paper |
- CHF61
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