Abstract
PreviewISO 29301:2017 specifies a calibration procedure applicable to images recorded over a wide magnification range in a transmission electron microscope (TEM). The reference materials used for calibration possess a periodic structure, such as a diffraction grating replica, a super-lattice structure of semiconductor or an analysing crystal for X-ray analysis, and a crystal lattice image of carbon, gold or silicon. This document is applicable to the magnification of the TEM image recorded on a photographic film, or an imaging plate, or detected by an image sensor built into a digital camera. This document also refers to the calibration of a scale bar. This document does not apply to the dedicated critical dimension measurement TEM (CD-TEM) and the scanning transmission electron microscope (STEM).
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Status: PublishedPublication date: 2017-12
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Edition: 2Number of pages: 44
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- ICS :
- 37.020 Optical equipment
Buy this standard
Format | Language | |
---|---|---|
std 1 166 | PDF + ePub | |
std 2 166 | Paper |
- CHF166
Life cycle
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Previously
WithdrawnISO 29301:2010
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Now
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Revised by
Under developmentISO 29301
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