Abstract
This document provides guidance for sample preparation, data acquisition by transmission electron microscopy, data processing, and three-dimensional image reconstruction to measure size and shape parameters of nano-objects on rod-shaped supports. The method is applicable to samples dispersed on or within an electron-transparent rod-shaped support.
General information
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Status: PublishedPublication date: 2021-06Stage: Close of review [90.60]
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Edition: 1Number of pages: 43
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Technical Committee :ISO/TC 229ICS :07.120
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